Description
The entrance into the top class of Mahr surface metrology. The PC-based equipment provides all common parameters and profiles according to international standards.
- Quick & Easy is Mahr specific operation help for quick and simple operation convenience
- You do not have to be afraid of the high performance level! Clear symbols are self-explanatory!
- The measuring station for laboratory and production line. Manifold configurations possible which opens ways into the huge world of micro dimensions in surface metrology
Features
Measurement/Evaluation:
PC system with windows operating system and MarSurf XR 20 software applications in German, English, French, Italian and Spanish language.
Parameters and Profiles:
More than 65 parameters for R, P and W profiles and MOTIF; including tolerance monitoring and statistics. – Parameter lists and characteristic diagrams
Profile Resolution:
Up to 76 nm at ± 25 µm, depending on type of applied probe
Measuring Range:
± 25 µm up to ± 250 µm, depending on type of applied probe
Sampling Lengths N:
1 up to 5 or 1 up to Nmax in N x Lc mode. Nmax = maximum tracing lengths of drive unit / selected Lc
Filter Types:
GS / 2RC / SF ISO 13565-1 / Profile Inversion NEG / ARC- (Elimination of Arc).- Further special filters as extra option
Cutoff Lc:
Free Lc selection possible, maximum 25 mm Lc = f(lt); 0,025 mm / 0,08 mm / 0,25 mm / 0,8 mm / 2,5 mm / 8 mm as well as Lc short and default value according to ISO 4288; limits depend on Lt and dx.
Ls filter free selection from 1,5 up to 100 µm or select from: 2,5 µm / 8 µm / 25 µm
Drive Units:
PZK, GD 25, PGK 20, PGK 120, PRK (via PAV 62)
Download MarSur XR20 Flyer